Domains targeting keyword variable angle spectroscopic ellipsometers
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ジェー・エー・ウーラム・ジャパン - Homehttp://pageoverview.com/website-report/jawjapan.com
J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.
- Expected expiration: July 26th in 2018
- Creation date: July 26th in 2005
- Renew date: June 22nd in 2017
- Google Analytics: 33657899-1